Abstract
Autonomous Finite State Machines constructed from shift registers and EXOR gates only are attractive as test pattern generators for Built-in Self Test. Popular TPGs like LFSRs and CA are one such class of Autonomous Linear Finite State Machines. In this dissertation a general theory of maximal sequence ALFSMs is develped. It is shown that such ALFSMs can be realized in an alternate modular form with fixed automata and a variable hardware consisting of EXOR gates. This implementation leads to sharing of the fixed automata among different ALFSMs. Using the theory TPGs for exhaustive two pattern testing of stuck open/delay-y faults are developed with a possible extension to higher dimensions. A synthesis algorithm for constructing Generalized Cellular Automata is also presented. Finally a fast algorithm for bounding a parameter of interest called fault detection probability of stuck-at faults is also presented for its usefulness in indentifying hard-to-detect faults.
Pathak, Rajesh (1995). Autonomous linear finite state machines for built-in self test of digital circuits : theory and applications. Texas A&M University. Texas A&M University. Libraries. Available electronically from
https : / /hdl .handle .net /1969 .1 /DISSERTATIONS -1562510.