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FZ crystal growth of monochromator-grade YB66 single crystals as guided by topographic and double-crystal diffraction characterization 
(出版日: 1998-12-21)
https://hdl.handle.net/20.500.11932/458045 
| コレクション: | NIMS成果物 |
| 形態: |
オンラインリソース
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| 言語: | 不明 |
| ページ数と大きさ: | 11 p. (141 - 151) |
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| 識別子: | Handle URI: https://hdl.handle.net/20.500.11932/458045 |
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| アブストラクト: |
YB66 crystals grown with an indirect heating floating zone method were extensively characterized using a variety of X-ray diffraction techniques such as synchrotron white beam transmission and reflection topography, section topography and conventional double-crystal rocking curve measurements using Cu Kα and Mg Kα sources. The observed crystal defects and deformations were correlated with changes in the crystal growth process. The interplay beween systematic characterization and process improvements results in the growth of high quality single crystals of YB66 that can be used as an efficient element for monochromatization of synchrotron soft X-ray in the 1 2 keV energy range. |
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