Stimulated electron energy loss and gain in an electron microscope without a pulsed electron gun

Stimulated electron energy loss and gain in an electron microscope without a pulsed electron gun

P. Das, J. D. Blazit, M. Tencé, L. F. Zagonel, Y. Auad, Y. H. Lee, X. Y. Ling, A. Losquin, C. Colliex, O. Stéphan, F. J. García de Abajo, M. Kociak

ARTIGO

Inglês

Agradecimentos: MK wants to thank F. Houdellier and A. Arbouet for fruitful discussions. This work has received support from the National Agency for Research under the program of future investment TEMPOS-CHROMATEM with the Reference No. ANR-10-EQPX-50 and FEMTOTEM ANR-14-CE26-0013. FJGA acknowledges...

Abstract: We report on a novel way of performing stimulated electron energy-loss and energy-gain spectroscopy (sEELS/sEEGS) experiments that does not require a pulsed gun. In this scheme, a regular scanning transmission electron microscope (STEM) equipped with a conventional continuous electron gun...

FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESP

2014/23399-9; 2017/00259-5

Fechado

Stimulated electron energy loss and gain in an electron microscope without a pulsed electron gun

P. Das, J. D. Blazit, M. Tencé, L. F. Zagonel, Y. Auad, Y. H. Lee, X. Y. Ling, A. Losquin, C. Colliex, O. Stéphan, F. J. García de Abajo, M. Kociak

										

Stimulated electron energy loss and gain in an electron microscope without a pulsed electron gun

P. Das, J. D. Blazit, M. Tencé, L. F. Zagonel, Y. Auad, Y. H. Lee, X. Y. Ling, A. Losquin, C. Colliex, O. Stéphan, F. J. García de Abajo, M. Kociak

    Fontes

    Ultramicroscopy

    Vol. 203, nesp SI (Aug., 2019), p. 44-51