High-order PDEs test problems

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Unpublished conference/Abstract (Scientific congresses and symposiums)

Schiesser, W. E.; Saucez, Philippe; Vande Wouwer, Alain

2002 • SIAM 50th Anniversary and 2002 Annual Meeting

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https://hdl.handle.net/20.500.12907/18724

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Disciplines :

Electrical & electronics engineering

Author, co-author :

Schiesser, W. E.

Vande Wouwer, Alain ; Université de Mons > Faculté Polytechnique > Systèmes, Estimation, Commande et Optimisation

Language :

English

Title :

High-order PDEs test problems

Publication date :

01 January 2002

Number of pages :

Event name :

SIAM 50th Anniversary and 2002 Annual Meeting

Event place :

Philadelphia, United States - Pennsylvania

Event date :

2002

Research unit :

F107 - Systèmes, Estimation, Commande et Optimisation
F151 - Mathématique et Recherche opérationnelle

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