Reply to the 'Comment on 'Extent of conjugation in diazonium-derived layers in molecular junction devices determined by experiment and modelling'' by R. L. McCreery, S. K. Saxena, M. Supur and U. Tefashe, Phys. Chem. Chem. Phys., 2020, 22, DOI: 10.1039/d0cp02412k
bergren, adam; dilabio, gino; Van Dyck, Colinet al.
Van Dyck, Colin ; Université de Mons > Faculté des Sciences > Service Décanat-Site CHRL (Charleroi) de la Faculté des Sciences
Mukundan, Vineetha
Fereiro, Jerry
Language :
English
Title :
Reply to the 'Comment on 'Extent of conjugation in diazonium-derived layers in molecular junction devices determined by experiment and modelling'' by R. L. McCreery, S. K. Saxena, M. Supur and U. Tefashe, Phys. Chem. Chem. Phys., 2020, 22, DOI: 10.1039/d0cp02412k
Publication date :
14 September 2020
Journal title :
Physical Chemistry Chemical Physics
ISSN :
1463-9076
Publisher :
Royal Society of Chemistry, United Kingdom
Volume :
22
Peer reviewed :
Peer Reviewed verified by ORBi
Research unit :
S819 - Décanat-Site CHRL (Charleroi) de la Faculté des Sciences
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
