Unpublished conference/Abstract (Scientific congresses and symposiums)Organic Semiconducting Self-Assembled Nanostructure Characterization: The Key Role of Scanning Probe Microscopies
Leclère, Philippe
2010 • International Workshop on 'Scanning Probe Microscopy for Energy Applications'
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Research center :
CIRMAP - Centre d'Innovation et de Recherche en Matériaux Polymères
Leclère, Philippe ;
Université de Mons > Faculté des Sciences > Chimie des matériaux nouveaux Title :
Organic Semiconducting Self-Assembled Nanostructure Characterization: The Key Role of Scanning Probe Microscopies
Publication date :
15 September 2010
Event name :
International Workshop on 'Scanning Probe Microscopy for Energy Applications'
Event place :
Oak Ridge, United States - Tennessee
Research unit :
S817 - Chimie des matériaux nouveaux
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
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