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Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis
Cossement, D.; Renaux, F.; Thiry, D. et al.
2015In Applied Surface Science, 355, p. 842-848
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Research center :
CIRMAP - Centre d'Innovation et de Recherche en Matériaux Polymères
Disciplines :
Chemistry
Author, co-author :
Cossement, D.
Renaux, F.
Thiry, D.
Ligot, Sylvie 
Francq, Remy
Snyders, Rony  ;  Université de Mons > Faculté des Sciences > Chimie des Interactions Plasma-Surface
Language :
English
Title :
Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis
Publication date :
15 November 2015
Journal title :
Applied Surface Science
ISSN :
0169-4332
Publisher :
Elsevier, Netherlands
Volume :
355
Pages :
842-848
Peer reviewed :
Peer Reviewed verified by ORBi
Research unit :
S882 - Chimie des Interactions Plasma-Surface
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
Available on ORBi UMONS :
since 15 January 2016

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