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Poster (Scientific congresses and symposiums)
XPS depth profile analysis of oxygen-functionalised vertically aligned carbon nanotubes: are tip and walls being functionalized?
Bittencourt, Carla; Ke, Xiaoxing; Van Tendeloo, Gustaaf et al.
2010 • Intel European Research and Innovation Conference
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https://hdl.handle.net/20.500.12907/33362
 

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Disciplines :
Chemistry
Physics
Author, co-author :
Bittencourt, Carla  
Ke, Xiaoxing
Van Tendeloo, Gustaaf
Navio Bernabeu, Cristina
Godfroid, Thomas
Snyders, Rony  ;  Université de Mons > Faculté des Sciences > Chimie des Interactions Plasma-Surface
Colomer, Jean-François
Suarez-Martinez, I.
Ewels, C.
Language :
English
Title :
XPS depth profile analysis of oxygen-functionalised vertically aligned carbon nanotubes: are tip and walls being functionalized?
Publication date :
12 October 2010
Number of pages :
1
Event name :
Intel European Research and Innovation Conference
Event place :
Leixlip, Ireland
Event date :
2010
Research unit :
S882 - Chimie des Interactions Plasma-Surface
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
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since 02 February 2011

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