Authors: | Schlünder, Christian |
Title: | Zuverlässigkeit von sub-µm-CMOS-Schaltungen bei Bias-Temperature-Stress (BTS) |
Language (ISO): | de |
Subject Headings: | Zuverlässigkeit Bias Temperature Stress BTS NBTI Degradation MOSFET |
URI: | http://hdl.handle.net/2003/24191 http://dx.doi.org/10.17877/DE290R-8410 |
Issue Date: | 2007-03-21T13:18:28Z |
Appears in Collections: | Lehrstuhl für Bauelemente der Elektrotechnik |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Abstract Dissertation Chr_Schlünder.pdf | 60.05 kB | Adobe PDF | View/Open | |
Dissertation.pdf | DNB | 1.74 MB | Adobe PDF | View/Open |
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