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Soft X-ray polychromator for the Solar Maximum MissionThe XRP was designed to measure the following temporal and spatial properties of the active and flaring Sun: electron temperature, departures from steady state, ion kinetic temperatures, and electron density. The Bent Crystal Spectrometer (BCS) is capable of measuring the broadening and blue shifts often observed in the impulsive phase of flares. The six simultaneous line fluxes indicative of six different temperatures of formation observable by the Flat Crystal Spectrometer (FCS) allows the derivation of the differential emission measure of the plasma at each raster point. During the operational periods of the XRP hundreds of flares of C-level (GOES classification) were observed and brighter in both the FCS and BCS, including 5 X-flares. Associated theoretical work in atomic physics, stimulated in part by the promise of XRP measurements, has benefitted from the experimental data on solar plasmas which the XRP has provided in abundance.
Document ID
19850024783
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Haisch, B. M.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Levay, M.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Stern, R. A.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Strong, K. T.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Wolfson, C. J.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Acton, L. W.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Date Acquired
September 5, 2013
Publication Date
December 1, 1984
Subject Category
Solar Physics
Report/Patent Number
NASA-CR-175297
NAS 1.26:175297
Accession Number
85N33096
Funding Number(s)
CONTRACT_GRANT: NAS5-23758
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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