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Heterogenous void growth revealed by in situ 3-D X-ray mocrotomography using automatic cavity tracking
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Document type | Article de périodique (Journal article) – Article de recherche |
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Access type | Accès restreint |
Publication date | 2014 |
Language | Anglais |
Journal information | "Acta Materialia" - Vol. 63, p. 130-139 |
Peer reviewed | yes |
Publisher | Pergamon ((United Kingdom) Kidlington) |
issn | 1359-6454 |
e-issn | 1873-2453 |
Publication status | Publié |
Affiliations |
UCL
- SST/IMMC/IMAP - Materials and process engineering UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique |
Links |
Bibliographic reference | Lecarme, Liza ; Maire, Eric ; K.C., Amit Kumar ; De Vleeschouwer, Christophe ; Jacques, Laurent ; et. al. Heterogenous void growth revealed by in situ 3-D X-ray mocrotomography using automatic cavity tracking. In: Acta Materialia, Vol. 63, p. 130-139 |
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Permanent URL | http://hdl.handle.net/2078.1/135237 |