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Optical tomography based on phase-shifting schlieren deflectometry

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Foumouo, Emmanuel [UCL] Dewandel, J.-L. Joannes, L. Beghuin, D. Jacques, Laurent [UCL] Antoine, Philippe [UCL]

We present a new optical tomography technique based on phase-shifting schlieren deflectometry. The principle is that of computerized tomography. The three-dimensional profile is reconstructed from the deflection angles of rays passing through the tested object. We have investigated optical phantoms chosen in view of the characterization of dendritic growth in a solidification process. Promising results have been obtained with a homogeneous sphere and a bundle of 200 mu m fibers. The deviation angles exceed two degrees with a variation of the refractive index Delta n = 0.025.

Document type Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection
Publication date 2010
Language Anglais
Conference "Optical Sensing and Detection", Brussels, Belgium (12-15 April 2010)
issn 0277-786X
Host document "Optical Sensing and Detection"- Vol. 7726, 77260U (8 pp.)
Publisher SPIE - the international society for optical engineering
Publication status Publié
Affiliations UCL - SST/IMCN - Institute of Condensed Matter and Nanosciences
UCL - SST/ICTM - Institute for Information and Communication. Technologies, Electronics and Applied Mathematics
Keywords optical tomography ; deflectometry ; inverse problem
Links
Bibliographic reference Foumouo, Emmanuel ; Dewandel, J.-L. ; Joannes, L. ; Beghuin, D. ; Jacques, Laurent ; et. al. Optical tomography based on phase-shifting schlieren deflectometry.Optical Sensing and Detection (Brussels, Belgium, 12-15 April 2010). In: Optical Sensing and Detection, SPIE - the international society for optical engineering2010, p.Vol. 7726, 77260U (8 pp.)
Permanent URL http://hdl.handle.net/2078.1/67400