Scanning microfocus small-angle X-ray scattering: A new tool to investigate 
defects at polymer-polymer interfaces

Lorenz-Haas, C.; Müller-Buschbaum, P.; Wunnicke, O.; Cassignol, C.; Burghammer, M.; Riekel, C.; Stamm, Manfred

doi:10.1021/la026693+

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Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces

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Lorenz-Haas, C.
MPI for Polymer Research, Max Planck Society;

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Cassignol, C.
MPI for Polymer Research, Max Planck Society;

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Lorenz-Haas, C., Müller-Buschbaum, P., Wunnicke, O., Cassignol, C., Burghammer, M., Riekel, C., et al. (2003). Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces. Langmuir, 19(7), 3056-3061. doi:10.1021/la026693+.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-6234-2

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