Molecular beam epitaxy of the half-Heusler antiferromagnet CuMnSb

Scheffler, L.; Gas, K.; Banik, S.; Kamp, M.; Knobel, J.; Lin, H.; Schumacher, C.; Gould, C.; Sawicki, M.; Kleinlein, J.; Molenkamp, L. W.

doi:10.1103/PhysRevMaterials.4.114402

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Molecular beam epitaxy of the half-Heusler antiferromagnet CuMnSb

MPS-Authors

/persons/resource/persons253005

Lin, H.
Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

/persons/resource/persons253002

Molenkamp, L. W.
Laurens Molenkamp, Max Planck Fellow, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Scheffler, L., Gas, K., Banik, S., Kamp, M., Knobel, J., Lin, H., et al. (2020). Molecular beam epitaxy of the half-Heusler antiferromagnet CuMnSb. Physical Review Materials, 4(11): 114402, pp. 1-6. doi:10.1103/PhysRevMaterials.4.114402.

Cite as: https://hdl.handle.net/21.11116/0000-0007-7B7A-7

Abstract

We report the growth of CuMnSb thin films by molecular beam epitaxy on InAs (001) substrates. The CuMnSb layers are compressively strained (0.6 %) due to lattice mismatch. The thin films have a CO full width at halfmaximum of 7.7 arcsec according to high resolution x-ray diffraction, and a root-mean-square roughness of 0.14 nm as determined by atomic force microscopy. Magnetic and electrical properties are found to be consistent with reported values from bulk samples. We find a Neel temperature of 62 K, a Curie-Weiss temperature of -65 K, and an effective moment of 5.9 mu B/f.u. Transport measurements confirm the antiferromagnetic transition and show a residual resistivity at 4 K of 35 mu Omega cm.