Correction note: Biaxial machine at Diffabs beamline for studying mechanical 
properties of thin films deposited onto polymer substrates (Matériaux 
Techniques (2015) 103 (610) DOI: 10.1051/mattech/2015057)

Faurie, Damien; Djaziri, Soundès; Renault, Pierre Olivier; Le Bourhis, Éric; Goudeau, Philippe H.; Geandier, Guillaume; Thiaudière, Dominique

doi:10.1051/mattech/2018040

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Correction note: Biaxial machine at Diffabs beamline for studying mechanical properties of thin films deposited onto polymer substrates (Matériaux Techniques (2015) 103 (610) DOI: 10.1051/mattech/2015057)

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Djaziri, Soundès
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Institut Pprime, Universite de Poitiers, Futuroscope Cedex, France;

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Faurie, D., Djaziri, S., Renault, P. O., Le Bourhis, É., Goudeau, P. H., Geandier, G., & Thiaudière, D. (2018). Correction note: Biaxial machine at Diffabs beamline for studying mechanical properties of thin films deposited onto polymer substrates (Matériaux Techniques (2015) 103 (610) DOI: 10.1051/mattech/2015057). Materiaux et Techniques, 106(2):. doi:10.1051/mattech/2018040.

引用: https://hdl.handle.net/21.11116/0000-0003-A47B-A

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