Lock-in thermography for analyzing solar cells and failure analysis in other 
electronic components

Breitenstein, Otwin; Sturm, Steffen

doi:10.1080/17686733.2018.1563349

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Journal Article

Lock-in thermography for analyzing solar cells and failure analysis in other electronic components

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Breitenstein, Otwin
Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society;

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Breitenstein2019.pdf
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Breitenstein, O., & Sturm, S. (2019). Lock-in thermography for analyzing solar cells and failure analysis in other electronic components. Quantitative InfraRed Thermography Journal, 16(3-4), 1-15. doi:10.1080/17686733.2018.1563349.

Cite as: https://hdl.handle.net/21.11116/0000-0009-0CE5-8

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