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Hennies+20_SciRep_.pdf (Publisher version), 4MB
Hennies, J., Lleti, J. M. S., Schieber, N. L., Templin, R. M., Steyer, A. M., & Schwab, Y. (2020). AMST: Alignment to Median Smoothed Template for Focused Ion Beam Scanning Electron Microscopy Image Stacks. Scientific Reports, 10: 2004. doi:10.1038/s41598-020-58736-7.