PIP-20-155-R1-Postprint.pdf (1.39 MB)
Interlaboratory comparison of angular-dependent photovoltaic device measurements: Results and impact on energy rating
journal contribution
posted on 2021-03-25, 14:09 authored by N Riedel-Lyngskær, AA Santamaría Lancia, F Plag, I Kröger, MR Vogt, C Schinke, RS Davidsen, M Amdemeskel, MJ Jansen, P Manshanden, LH Slooff, AJ Carr, Martin BlissMartin Bliss, Tom BettsTom Betts, ME Mayo, IP Jauregui, JL Balenzategui, R Roldan, G Bellenda, M Caccivio, U Kräling, F Neuberger, D Zirzow, J Crimmins, C Robinson, B King, W Teasdale, C Kedir, J Watts, R Desharnais, PB Poulsen, ML Jakobsen, GA dos Reis Benatto© 2020 John Wiley & Sons, Ltd. This paper presents the results from an extensive interlaboratory comparison of angular-dependent measurements on encapsulated photovoltaic (PV) cells. Twelve international laboratories measure the incident angle modifier of two unique PV devices. The absolute measurement agreement is ±2.0% to the weighted mean for angles of incidence (AOI) ≤ 65°, but from 70° to 85°, the range of measurement deviations increases rapidly from 2.5% to 23%. The proficiency of the measurements is analysed using the expanded uncertainties published by seven of the laboratories, and it is found that most of the angular-dependent measurements are reproducible for AOI ≤ 80°. However, at 85°, one laboratory's measurement do not agree to the weighted mean within the stated uncertainty, and measurement uncertainty as high as 16% is needed for the laboratories without uncertainty to be comparable. The poor agreement obtained at 85° indicates that the PV community should place minimal reliance on angular-dependent measurements made at this extreme angle until improvements can be demonstrated. The cloud-based Daidalos ray tracing model is used to simulate the angular-dependent losses of the mono-Si device, and it is found that the simulation agrees to the median measurement within 0.6% for AOI ≤ 70° and within 1.4% for AOI ≤ 80°. Finally, the impact that the angular-dependent measurement deviations have on climate specific energy rating (CSER) is evaluated for the six climates described in the IEC 61853-4 standard. When one outlier measurement is excluded, the angular-dependent measurements reported in this work cause a 1.0%–1.8% range in CSER and a 1.0%–1.5% range in annual energy yield, depending on the climate.
Funding
Danish Energy Technology Development and Demonstration Program (EUDP) project number 64016-0030
U.S. Department of Energy’s Office of Energy Efficiency and Renewable Energy (EERE) under Solar Energy Technologies Office (SETO) Agreement Number 34364
U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525
History
School
- Mechanical, Electrical and Manufacturing Engineering
Research Unit
- Centre for Renewable Energy Systems Technology (CREST)
Published in
Progress in Photovoltaics: Research and ApplicationsVolume
29Issue
3Pages
315 - 333Publisher
WileyVersion
- AM (Accepted Manuscript)
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© WileyPublisher statement
This is the peer reviewed version of the following article: Riedel-Lyngskær, N. ... et al., (2021). Interlaboratory comparison of angular-dependent photovoltaic device measurements: Results and impact on energy rating. Progress in Photovoltaics: Research and Applications, 29(3_, pp. 315-333, which has been published in final form at https://doi.org/10.1002/pip.3365. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived VersionsAcceptance date
2020-10-22Publication date
2020-12-15Copyright date
2021ISSN
1062-7995eISSN
1099-159XPublisher version
Language
- en
Depositor
Dr Tom Betts. Deposit date: 19 March 2021Usage metrics
Keywords
angle of incidenceangular‐dependent lossesdiffuse irradianceenergy ratingincidence angle modifierinterlaboratory comparisonoptical lossesrelative transmittanceScience & TechnologyTechnologyPhysical SciencesEnergy & FuelsMaterials Science, MultidisciplinaryPhysics, AppliedMaterials SciencePhysicsREFLECTION LOSSESSOLAR-CELLPV MODULESMODELApplied PhysicsElectrical and Electronic EngineeringMaterials EngineeringCondensed Matter Physics
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