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Impact of radiation-induced soft error on embedded cryptography algorithms
journal contribution
posted on 2021-11-15, 10:08 authored by Vitor Bandeira, Jack Sampford, Rafael Garibotti, Matheus Garay Trindade, Rodrigo Possamai Bastos, Ricardo Reis, Luciano OstLuciano OstWith the advance of autonomous systems, security is becoming the most crucial feature in different domains, highlighting the need for protection against potential attacks. Mitigation of these types of attacks can be achieved using embedded cryptography algorithms, which differ in performance, area, and reliability. This paper compares hardware implementations of the eXtended Tiny Encryption Algorithm (XTEA) and the Advanced Encryption Standard (AES) algorithms. Results show that the XTEA implementation gives the best relative performance (e.g., throughput, power), area, and soft error reliability trade-offs.
Funding
MultiRad project funded by Région Auvergne-Rhône-Alpes’s international ambition pack
History
School
- Mechanical, Electrical and Manufacturing Engineering
Published in
Microelectronics ReliabilityVolume
126Publisher
Elsevier BVVersion
- AM (Accepted Manuscript)
Rights holder
© ElsevierPublisher statement
This paper was accepted for publication in the journal Microelectronics Reliability and the definitive published version is available at https://doi.org/10.1016/j.microrel.2021.114349Acceptance date
2021-08-17Publication date
2021-09-02Copyright date
2021ISSN
0026-2714Publisher version
Language
- en
Depositor
Dr Luciano Ost. Deposit date: 12 November 2021Article number
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