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Impact of radiation-induced soft error on embedded cryptography algorithms

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posted on 2021-11-15, 10:08 authored by Vitor Bandeira, Jack Sampford, Rafael Garibotti, Matheus Garay Trindade, Rodrigo Possamai Bastos, Ricardo Reis, Luciano OstLuciano Ost
With the advance of autonomous systems, security is becoming the most crucial feature in different domains, highlighting the need for protection against potential attacks. Mitigation of these types of attacks can be achieved using embedded cryptography algorithms, which differ in performance, area, and reliability. This paper compares hardware implementations of the eXtended Tiny Encryption Algorithm (XTEA) and the Advanced Encryption Standard (AES) algorithms. Results show that the XTEA implementation gives the best relative performance (e.g., throughput, power), area, and soft error reliability trade-offs.

Funding

MultiRad project funded by Région Auvergne-Rhône-Alpes’s international ambition pack

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

Microelectronics Reliability

Volume

126

Publisher

Elsevier BV

Version

  • AM (Accepted Manuscript)

Rights holder

© Elsevier

Publisher statement

This paper was accepted for publication in the journal Microelectronics Reliability and the definitive published version is available at https://doi.org/10.1016/j.microrel.2021.114349

Acceptance date

2021-08-17

Publication date

2021-09-02

Copyright date

2021

ISSN

0026-2714

Language

  • en

Depositor

Dr Luciano Ost. Deposit date: 12 November 2021

Article number

114349

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