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Soft error assessment of attitude estimation algorithms running on resource-constrained devices under neutron radiation

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journal contribution
posted on 2024-03-13, 10:05 authored by Jonas Gava, Tarso Sartori, Alex HannemanAlex Hanneman, Rafael Garibotti, Fernando Moraes, Ney Calazans, Hassen Fourati, Rodrigo Bastos, Ricardo Reis, Luciano OstLuciano Ost

There is a growing incorporation of unmanned aerial vehicles (UAVs) within remote and urban environments due to their versatility and ability to access hard-to-reach and/or congested places. UAVs offer low-cost solutions for many applications, including healthcare (e.g., medical supplies delivery) and surveillance during public events, protests, or emergencies (e.g., nuclear accident). However, drone utilisation in urban areas often relies on strict regulations to ensure safe and responsible operation. UAVs are subject to radiation-induced soft errors, and identifying the most vulnerable software and hardware components to radiation exposure is a advisable task, which is difficult to undertake. An essential task to UAVs correct operation is attitude estimation. This paper assesses the soft error reliability of three attitude estimation algorithms running on two resource-constrained microprocessors under neutron radiation. Results suggest that the extended Kalman filter (EKF) algorithm provides the best mean work to failure result for critical fault events, which is about 3× more than the indirect Kalman filter (IKF) and 1.5× more w.r.t. the novel quaternion Kalman filter algorithm (NQKF).

Funding

MultiRad (PAI project funded by Région Auvergne-Rhône-Alpes)

DTP 2018-19 Loughborough University

Engineering and Physical Sciences Research Council

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IRT Nanoelec (ANR-10-AIRT-05 project funded by French PIA)

UGA/LPSC/GENESIS platform

CAPES

CNPq (grants no. 317087/2021-5 and 407477/2022-5)

FAPERGS

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

IEEE Transactions on Nuclear Science

Publisher

Institute of Electrical and Electronics Engineers

Version

  • AM (Accepted Manuscript)

Rights holder

© IEEE

Publisher statement

© 2024 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Acceptance date

2024-03-12

Publication date

2024-03-18

Copyright date

2024

ISSN

0018-9499

eISSN

1558-1578

Language

  • en

Depositor

Dr Luciano Ost. Deposit date: 12 March 2024

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