Article (Scientific journals)
XPS data analysis via Wavelets and Fourier Transform.
Charles, Catherine; Rasson, Jean-Paul; Leclerc, Gervais
2004In Surface and Interface Analysis, 36, p. 71-80
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Disciplines :
Physics
Author, co-author :
Charles, Catherine ;  Université de Liège - ULiège > Gembloux Agro-Bio Tech > Gembloux Agro-Bio Tech
Rasson, Jean-Paul;  Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > Mathématiques > Statistiques
Other collaborator :
Leclerc, Gervais;  Facultés Universitaires Notre-Dame de la Paix - Namur - FUNDP > Physique
Language :
English
Title :
XPS data analysis via Wavelets and Fourier Transform.
Publication date :
2004
Journal title :
Surface and Interface Analysis
ISSN :
0142-2421
eISSN :
1096-9918
Publisher :
John Wiley & Sons, Hoboken, United States - New Jersey
Volume :
36
Pages :
71-80
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 10 September 2009

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