An evaluation and comparison of conducted emission test methods for Integrated Circuits

Kennedy, S.; Yuce, M. R.; Redouté, Jean-Michel

doi:10.1109/GEMCCON.2015.7386859

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An evaluation and comparison of conducted emission test methods for Integrated Circuits

Kennedy, S.; Yuce, M. R.; Redouté, Jean-Michel

2015 • In Conference Proceedings - GEMCCON 2015: IEEE Global Electromagnetic Compatibility Conference

Peer reviewed

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https://hdl.handle.net/2268/236432

DOI
10.1109/GEMCCON.2015.7386859

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Keywords :

Electromagnetic compatibility; Integrated circuits; Reconfigurable hardware; Charge pump; Conducted emissions; Frequency performance; Line impedance; TEM cell; Test method; Networks (circuits)

Abstract :

[en] This paper presents a comparison of conducted emission test measurements. Traditional Line Impedance Stabilisation Network (LISN) conducted emission methods are compared with Integrated Circuits (IC) test methods including 1 Ω, direct and TEM cell methods. The frequency performance of each method is explored as well as performance above the present 30 MHz limit. Correlation of results of different methods explored through simulation results and measurements from a charge pump IC. © 2015 IEEE.

Disciplines :

Electrical & electronics engineering

Author, co-author :

Kennedy, S.; Department of Electrical and Computer Systems Engineering, Monash University, Clayton, VIC, Australia

Yuce, M. R.; Department of Electrical and Computer Systems Engineering, Monash University, Clayton, VIC, Australia

Redouté, Jean-Michel ; Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés

Language :

English

Title :

An evaluation and comparison of conducted emission test methods for Integrated Circuits

Publication date :

2015

Event name :

IEEE Global Electromagnetic Compatibility Conference, GEMCCON 2015

Event date :

10 November 2015 through 12 November 2015

Audience :

International

Journal title :

Conference Proceedings - GEMCCON 2015: IEEE Global Electromagnetic Compatibility Conference

Publisher :

Institute of Electrical and Electronics Engineers Inc.

Peer reviewed :

Peer reviewed

Commentary :

119272 9781467385480

Available on ORBi :

since 07 June 2019

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Bibliography

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