<Book>
Diffusion mechanism of nickel and point defects in silicon (Japanese journal of applied physocs, vol.21 no.2)
Responsibility | Masayuki Yoshida |
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Material Type | Book |
Publisher | Tokyo |
Language | English |
Holdings
Status | Volume | Location | Call No. | Printed | Collection Name | Barcode No. | Comments | Reserve | Copy | Automatic archive |
---|---|---|---|---|---|---|---|---|---|---|
|
DESIGN LIB., 3F | Books Written by Faculty | AAA611/ヨシダマ/23 | 1982 |
|
072031281015782 |
|
Bibliographic details
Authors | 吉田, 正幸 <ヨシダ、 マサユキ> |
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ID | 1000005229 |
NCID | LB21866082 |
Created Date | 1995.03.01 |
Modified Date | 2005.10.03 |