Please use this identifier to cite or link to this item:
https://hdl.handle.net/2440/69849
Citations | ||
Scopus | Web of Science® | Altmetric |
---|---|---|
?
|
?
|
Type: | Journal article |
Title: | Focussed ion beam-transmission electron microscopy applications in ore mineralogy: Bridging micro- and nanoscale observations |
Author: | Ciobanu, C. Cook, N. Utsunomiya, S. Pring, A. Green, L. |
Citation: | Ore Geology Reviews, 2011; 42(1):6-31 |
Publisher: | Elsevier Science BV |
Issue Date: | 2011 |
ISSN: | 0169-1368 1872-7360 |
Statement of Responsibility: | C.L. Ciobanu, N.J. Cook, S. Utsunomiya, A. Pring, L. Green |
Abstract: | Focussed ion beam-scanning electron microscopy (FIB-SEM) is a relatively new analytical tool that has been little applied to problems of ore genesis. The technique enables high-resolution (cross-section) imaging and can be used to prepare thinned foils for study by transmission electron microscopy (TEM). FIB-SEM methods applied to sulphides and related compounds represent an in-situ approach for sample characterisation and thus provides for crystal-chemical data that can be placed into the geological context of a given ore deposit.We present four study cases: these deal with minor element incorporation and release in ZnS; intergrowths and replacement among Cu-(Fe)-sulphides; fabrics in Au-bearing, As-free pyrite; and symplectites of Bi-sulphosalts within galena. The data is discussed in the context of polytypism and planar defects for minor element incorporation and release, superstructure ordering and formation of fine particles (100-2500. nm) or nanoparticles (< 100. nm) during replacement processes. Several analytical difficulties encountered when preparing FIB-TEM samples from sulphides are discussed, in particular mechanical and chemical damage to the surface. The FIB-TEM foils are difficult to thin for direct high-resolution TEM imaging but are usable for Scanning Transmission Electron Microscopy (STEM) and High-Angle Annular Dark Field (HAADF)-STEM imaging. © 2011 Elsevier B.V. |
Keywords: | Focussed ion beam Transmission electron microscopy Ore textures Sphalerite Cu–Fe-sulphides Pyrite Pb–Bi-sulphosalts (Nano)particles |
Rights: | Copyright © 2011 Elsevier B.V. All rights reserved. |
DOI: | 10.1016/j.oregeorev.2011.06.012 |
Grant ID: | http://purl.org/au-research/grants/arc/DP1095069 |
Published version: | http://dx.doi.org/10.1016/j.oregeorev.2011.06.012 |
Appears in Collections: | Aurora harvest Geology & Geophysics publications |
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.