Publicação:
Structural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique

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2-s2.0-0038676283.pdf (113 KB)

Data

2003-03-01

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Coorientador

Pós-graduação

Curso de graduação

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Resumo

Strontium-modified lead titanate thin films with composition Pb1-xSrxTiO3 were grown on Pt/Ti/SiO2/Si substrates using the polymeric precursor method. The structural phase evolution as a function of the Sr contents was studied using micro-Raman scattering, specular reflectance infrared Fourier transform spectroscopy, and x-ray diffraction. The results showed a gradual change from tetragonal to cubic structure, the transition occurring at about x = 0.58. The infrared reflectance spectra showed that the frequency of several peaks decreases as the strontium concentration increases. These features are correlated with a decrease in the tetragonal distortion of the TiO6 octahedra as the strontium concentration increases.

Descrição

Palavras-chave

Doping (additives), Fourier transform infrared spectroscopy, Lead compounds, Raman scattering, Strontium, X ray diffraction analysis, Soft chemical techniques, Thin films

Idioma

Inglês

Como citar

Journal of Materials Research, v. 18, n. 3, p. 659-663, 2003.

URI

http://hdl.handle.net/11449/67212

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Araraquara - IQAR - Instituto de Química

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