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Record link: 
http://hdl.handle.net/20.500.12708/146674
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Title: 
Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis
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Citation: 
Rotella, H., Caby, B., Ménesguen, Y., Mazel, Y., Valla, A., Ingerle, D., Detlefs, B., Lépy, M.-C., Novikova, A., Rodriguez, G., Streli, C., & Nolot, E. (2017). Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis. Spectrochimica Acta Part B: Atomic Spectroscopy, 135, 22–28. https://doi.org/10.1016/j.sab.2017.06.011
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Publisher DOI: 
10.1016/j.sab.2017.06.011
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Publication Type: 
Article - Original Research Article
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Authors: 
Rotella, H. 
Caby, B. 
Ménesguen, Y. 
Mazel, Y. 
Valla, A. 
Ingerle, D. 
Detlefs, B. 
Lépy, M.-C. 
Novikova, A. 
Rodriguez, G. 
Streli, C. 
Nolot, E. 
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Organisational Unit: 
E141-05 - Forschungsbereich Radiation Physics 
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Journal: 
Spectrochimica Acta Part B: Atomic Spectroscopy 
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ISSN: 
0584-8547
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Date (published): 
2017
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Number of Pages: 
7
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Peer reviewed: 
Yes
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Keywords: 
Atomic and Molecular Physics, and Optics; Instrumentation; Spectroscopy; Analytical Chemistry
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Research Areas: 
Structure-Property Relationship: 100%
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Science Branch: 
Physik, Astronomie
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