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Record link: 
http://hdl.handle.net/20.500.12708/155454
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Title: 
Acoustic Phonon and Surface Roughness Spin Relaxation Mechanisms in Strained Ultra-Scaled Silicon Films
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Citation: 
Osintsev, D., Sverdlov, V., & Selberherr, S. (2014). Acoustic Phonon and Surface Roughness Spin Relaxation Mechanisms in Strained Ultra-Scaled Silicon Films. Advanced Materials Research, 854, 29–34. https://doi.org/10.4028/www.scientific.net/amr.854.29
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Publisher DOI: 
10.4028/www.scientific.net/amr.854.29
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Publication Type: 
Article - Original Research Article
en
Authors: 
Osintsev, Dmitry 
Sverdlov, V. 
Selberherr, Siegfried 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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ISSN: 
1022-6680
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Date (published): 
2014
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Number of Pages: 
6
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Peer reviewed: 
No
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Keywords: 
General Engineering
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Research Areas: 
Modelling and Simulation: 100%
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
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