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Record link: 
http://hdl.handle.net/20.500.12708/167261
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Title: 
Calibrated nanoscale capacitance measurements using a scanning microwave microscope
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Citation: 
Huber, H., Mörtelmaier, M., Wallis, T. M., Chiang, C. J., Hochleitner, M., Imtiaz, A., Oh, Y. J., Schilcher, K., Dieudonne, M., Smoliner, J., Hinterdorfer, P., Rosner, S. J., Tanbakuchi, H., Kabos, P., & Kienberger, F. (2010). Calibrated nanoscale capacitance measurements using a scanning microwave microscope. Review of Scientific Instruments, 81, 1137011–1137019. http://hdl.handle.net/20.500.12708/167261
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Publication Type: 
Article - Original Research Article
en
Authors: 
Huber, H. 
Mörtelmaier, M 
Wallis, T.M. 
Chiang, C.J. 
Hochleitner, M 
Imtiaz, A 
Oh, Y.J. 
Schilcher, K 
Dieudonne, M 
Smoliner, Jürgen 
Hinterdorfer, P 
Rosner, S.J. 
Tanbakuchi, H 
Kabos, P 
Kienberger, F 
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Organisational Unit: 
E362 - Institut für Festkörperelektronik 
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Journal: 
Review of Scientific Instruments 
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ISSN: 
0034-6748
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Date (published): 
2010
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Number of Pages: 
9
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Publisher: 
AIP PUBLISHING
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Peer reviewed: 
Yes
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Research Areas: 
Nanoelectronics: 50%
Materials Characterization: 50%
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
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