Detecting Ellipses in Elongated Shapes Using the Thickness Profile

Gabdulkhakova, Aysylu; Kropatsch, Walter G.

doi:10.1007/978-3-319-49055-7_37

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Record link:

http://hdl.handle.net/20.500.12708/57078

Title:

Detecting Ellipses in Elongated Shapes Using the Thickness Profile

Citation:

Gabdulkhakova, A., & Kropatsch, W. G. (2016). Detecting Ellipses in Elongated Shapes Using the Thickness Profile. In Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings (pp. 412–423). Springer Nature Switzerland AG 2021. https://doi.org/10.1007/978-3-319-49055-7_37

Publisher DOI:

10.1007/978-3-319-49055-7_37

Publication Type:

Inproceedings - Full-Paper Contribution

Authors:

Gabdulkhakova, Aysylu
Kropatsch, Walter G.

Organisational Unit:

E193-03 - Forschungsbereich Pattern Recognition and Image Processing

Published in:

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

DOI of the book:

10.1007/978-3-319-49055-7

Date (published):

2016

Number of Pages:

Publisher:

Springer Nature Switzerland AG 2021

Peer reviewed:

Yes

Keywords:

Shape analysis Shape description Ellipse detection

Abstract:

This paper presents a method that detects elliptical parts of a given elongated shape. For this purpose, first, the shape is represented by its skeleton. In case of branches, the skeleton is partitioned into a set of lines/curves. Second, the ellipse parameters are estimated using the thickness profile along each line/curve, and the properties of its first and second derivatives. The proposed meth...

Research Areas:

Visual Computing and Human-Centered Technology: 100%

Science Branch:

Informatik

Appears in Collections:

Conference Paper

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