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Record link: 
http://hdl.handle.net/20.500.12708/77867
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Title: 
Band gap measurements of ultra thin buried films using conical darkfield EFTEM and low voltage EFTEM
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Citation: 
Stöger-Pollach, M., Biedermann, K., & Beyer, V. (2014). Band gap measurements of ultra thin buried films using conical darkfield EFTEM and low voltage EFTEM. In 18#^{th} International Microscopy Congress Proceedings (p. 2). Czechoslovak Microscopy Society. http://hdl.handle.net/20.500.12708/77867
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Publication Type: 
Inproceedings - Poster Contribution
en
Authors: 
Stöger-Pollach, Michael 
Biedermann, Kati 
Beyer, V. 
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Organisational Unit: 
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie 
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Published in: 
18#^{th} International Microscopy Congress Proceedings 
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Date (published): 
2014
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Event name: 
18#^{th} International Microscopy Congress 
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Event date: 
7-Sep-2014 - 12-Sep-2014
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Event place: 
Prag, EU
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Number of Pages: 
2
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Publisher: 
Czechoslovak Microscopy Society
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Peer reviewed: 
No
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Science Branch: 
Physik, Astronomie
Chemie
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Appears in Collections:
Conference Paper

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