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Assessment of advanced SOI technologies for high-temperature applications
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| Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
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| Publication date | 2009 |
| Language | Anglais |
| Conference | "8th Edition of the Diagnostics and Yield Symposium", Warsaw (Poland) (du 22/06/2009 au 24/06/2009) |
| Peer reviewed | yes |
| Host document | "Proceedings of the 8th Edition of the Diagnostics and Yield Symposium" |
| Affiliation | UCL - FSA/ELEC - Département d'électricité |
| Keywords | SOI |
| Links |
| Bibliographic reference | Alvarado Pulido, José Joaquin ; Kilchytska, Valeriya ; Flandre, Denis. Assessment of advanced SOI technologies for high-temperature applications.8th Edition of the Diagnostics and Yield Symposium (Warsaw (Poland), du 22/06/2009 au 24/06/2009). In: Proceedings of the 8th Edition of the Diagnostics and Yield Symposium, 2009 |
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| Permanent URL | http://hdl.handle.net/2078.1/90358 |