Angular resolved scattering by a nano-textured ZnO/silicon interface

Schulte, M.; Zeman, M.; Jäger, K.; Pieters, B.E.; Bittkau, K.; Ermes, M.

doi:10.1063/1.3640238

Journal Article

Angular resolved scattering by a nano-textured ZnO/silicon interface

Schulte, M.FZJ* ; Bittkau, K.FZJ* ; Jäger, K. ; Ermes, M.FZJ* ; Zeman, M. ; Pieters, B. E.FZJ*

2011
American Institute of Physics Melville, NY

Applied physics letters 99, 111107 (2011) [10.1063/1.3640238]

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Please use a persistent id in citations: http://hdl.handle.net/2128/7335 doi:10.1063/1.3640238

Abstract: Textured interfaces in thin-film silicon solar cells improve the efficiency by light scattering. A technique to get experimental access to the angular intensity distribution (AID) at textured interfaces of the transparent conductive oxide (TCO) and silicon is introduced. Measurements are performed on a sample with polished microcrystalline silicon layer deposited onto a rough TCO layer. The AID determined from the experiment is used to validate the AID obtained by a rigorous solution of Maxwell's equations. Furthermore, the applicability of other theoretical approaches based on scalar scattering theory and ray tracing is discussed with respect to the solution of Maxwell's equations. (C) 2011 American Institute of Physics. [doi:10.1063/1.3640238]

Keyword(s): J

Classification:

Physics, Applied

Note: We thank Markus Hulsbeck, Astrid Besmehn, Matthias Meier, and Xu Xu for their contributions to this publication and the fruitful discussions. Furthermore, we thank Hugo Schlich from the Mateck GmbH for polishing the rough microcrystalline Si surface. Financial support by the BMU (Project No. 0327625) and Nuon Helianthos is gratefully acknowledged.

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