Effect of swift heavy ions irradiation in the migration of silver implanted into polycrystalline SiC

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Authors

Abdelbagi, Hesham Abdelbagi Ali
Skuratov, Vladimir Alexeevich
Motloung, Setumo Victor
Njoroge, Eric Gitau
Mlambo, Mbuso
Malherbe, Johan B.
O'Connell, Jacques H.
Hlatshwayo, Thulani Thokozani

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Elsevier

Abstract

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Keywords

Swift heavy ion (SHI), Rutherford backscattering spectrometry (RBS), Structure, SiC, Scanning electron microscopy (SEM), Raman spectroscopy, Transmission electron microscopy (TEM)

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Citation

Abdelbagi, H.A.A., Skuratov, V.A., Motloung, S.V. et al. 2019, 'Effect of swift heavy ions irradiation in the migration of silver implanted into polycrystalline SiC', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 461, pp. 201-209.