Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 × 1)

Date

2002-12-01

Author

Özer, Hakan Özgür
Atabak, Mehrdad
Oral, Ahmet

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Si(100)(2 × 1) surface is imaged using a new nc-AFM (non-contact atomic force microscopy)/STM with sub-Ångstrom oscillation amplitudes using stiff hand-made tungsten levers. Simultaneous force gradient and scanning tunneling microscopy images of individual dimers and atomic scale defects are obtained. We measured force-distance and dissipation-distance curves with different tips. Some of the tips show long-range force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. We also observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve.

URI

https://hdl.handle.net/11511/94526

Journal

Solid State Communications

DOI

https://doi.org/10.1016/s0038-1098(02)00547-1

Collections

Department of Physics, Article

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Citation Formats

H. Ö. Özer, M. Atabak, and A. Oral, “Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 × 1),” Solid State Communications, vol. 124, no. 12, pp. 469–472, 2002, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/94526.