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Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart

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Plachke,  D.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Khellaf,  A.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Stoll,  H.
Former Central Scientific Facility ANKA Synchroton Beamline, Max Planck Institute for Intelligent Systems, Max Planck Society;
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Carstanjen,  H. D.
Former Central Scientific Facility Pelletron Accelerator, Max Planck Institute for Intelligent Systems, Max Planck Society;
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Plachke, D., Blohm, G., Fischer, T., Khellaf, A., Kruse, O., Stoll, H., et al. (2001). Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart. In J. Duggan, & I. Morgan (Eds.), Proceedings of the 16th International Conference on Applications of Accelerators in Research and Industry (pp. 458-462). Melville, New York: AIP.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-36E3-3
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