Analytical TEM investigations of Pt/YSZ interfaces

Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Mutoro, E.; Janek, J.; Rühle, M.

doi:10.1007/978-3-540-85226-1_185

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Analytical TEM investigations of Pt/YSZ interfaces

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Srot, V.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken, P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle, M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Srot, V., Watanabe, M., Scheu, C., van Aken, P. A., Mutoro, E., Janek, J., & Rühle, M. (2008). Analytical TEM investigations of Pt/YSZ interfaces. In S., Richter, & A., Schwedt (Eds.), EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science (pp. 369-370). Berlin [et al.]: Springer.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-40FC-4

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