Infrared nanoscopy of strained semiconductors

Huber, A. J.; Ziegler, A.; Köck, T.; Hillenbrand, R.

doi:10.1038/nnano.2008.399

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Infrared nanoscopy of strained semiconductors

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Köck, T.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Huber, A. J., Ziegler, A., Köck, T., & Hillenbrand, R. (2009). Infrared nanoscopy of strained semiconductors. Nature Nanotechnology, 4(3), 153-157. doi:10.1038/nnano.2008.399.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0026-F593-6

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