Artifact-free, long-lasting phase plate

Kurth, P.; Pattai, S.; Rudolph, D.; Overbuschmann, J.; Wamser, J.; Irsen, S.

doi:10.1017/S1431927614002827

Local TagsRelease HistoryDetailsSummary

Artifact-free, long-lasting phase plate

Kurth, P., Pattai, S., Rudolph, D., Overbuschmann, J., Wamser, J., & Irsen, S. (2014). Artifact-free, long-lasting phase plate. Microscopy and Microanalysis, 20, 220-221. doi:10.1017/S1431927614002827.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-60B9-1 Version Permalink: https://hdl.handle.net/21.11116/0000-0008-87ED-5

Genre: Journal Article

Files

show Files

Locators

show

hide

Locator:
http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=9322808&fileId=S1431927614002827 (Any fulltext) Open Access status unknown

Description:
-

OA-Status:

Creators

show

hide

Creators:
Kurth, P., Author
Pattai, S., Author
Rudolph, D.¹, Author
Overbuschmann, J.¹, Author
Wamser, J., Author
Irsen, S.¹, Author

Affiliations:
1Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society, ou_2173680

Content

show

Details

show

hide

Language(s):

Dates: Date issued: 2014

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: DOI: 10.1017/S1431927614002827

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Microscopy and Microanalysis

Abbreviation : Microsc Microanal

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 20 Sequence Number: - Start / End Page: 220 - 221 Identifier: -