Beam-induced atomic migration at Ag-containing nanofacets at an asymmetric Cu 
grain boundary

Peter, Nicolas J.; Liebscher, Christian; Kirchlechner, Christoph; Dehm, Gerhard

doi:10.1557/jmr.2016.398

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Beam-induced atomic migration at Ag-containing nanofacets at an asymmetric Cu grain boundary

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Peter, Nicolas J.
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Liebscher, Christian
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kirchlechner, Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Dehm, Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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引用

Peter, N. J., Liebscher, C., Kirchlechner, C., & Dehm, G. (2017). Beam-induced atomic migration at Ag-containing nanofacets at an asymmetric Cu grain boundary. Journal of Materials Research, 32(5), 968-982. doi:10.1557/jmr.2016.398.

引用: https://hdl.handle.net/11858/00-001M-0000-002D-8ECC-8

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