Macroscopic interferometry: rethinking depth estimation with frequency-domain time-of-flight
Author(s)
Kadambi, Achuta; Schiel, Jamie; Raskar, Ramesh
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A form of meter-scale, macroscopic interferometry is proposed using conventional time-of-flight (ToF) sensors. Today, ToF sensors use phase-based sampling, where the phase delay between emitted and received, high-frequency signals encodes distance. This paper examines an alternative ToF architecture, inspired by micron-scale, microscopic interferometry, that relies only on frequency sampling: we refer to our proposed macroscopic technique as Frequency-Domain Time of Flight (FD-ToF). The proposed architecture offers several benefits over existing phase ToF systems, such as robustness to phase wrapping and implicit resolution of multi-path interference, all while capturing the same number of subframes. A prototype camera is constructed to demonstrate macroscopic interferometry at meter scale. ©2016
Date issued
2016-07Department
Program in Media Arts and Sciences (Massachusetts Institute of Technology); Massachusetts Institute of Technology. Media LaboratoryJournal
IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Kadambi, Achuta, Jamie Schiel, and Ramesh Raskar, "Macroscopic interferometry: rethinking depth estimation with frequency-domain time-of-flight." Proceedings, 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 26 June-1 Jul;y 2016, Las Vegas, Nevada (Piscataway, N.J.: IEEE, 2016): p. 893-902 doi 10.1109/CVPR.2016.103 ©2016 Author(s)
Version: Author's final manuscript