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Charge catastrophe and dielectric breakdown during exposure of organic thin films to low-energy electron radiation

Thete, A.; Geelen, D.; Molen, S.J. van der; Tromp, R.M. (2017)

Charge catastrophe and dielectric breakdown during exposure of organic thin films to low-energy electron radiation

Article / Letter to editor

All authors: Thete, A.; Geelen, D.; Molen, S.J. van der; Tromp, R.M.

Date: 2017

Journal: Physical Review Letters

Volume: 119

Issue: 26

Pages: 266803

DOI: doi:10.1103/PhysRevLett.119.266803