Creep Behavior and Microstructural Stability of Lamellar gamma-TiAl 
(Cr,Mo,Si,B) with Extremely Fine Lamellar Spacing

Schillinger, Wolfram; Zhang, Dezhi; Dehm, Gerhard; Bartels, Arno; Clemens, Helmut

アイテム詳細

登録内容を編集ファイル形式で保存

一時保存へ追加

タグ情報を表示リリース履歴を表示詳細要約

公開

会議論文

Creep Behavior and Microstructural Stability of Lamellar gamma-TiAl (Cr,Mo,Si,B) with Extremely Fine Lamellar Spacing

MPS-Authors

There are no MPG-Authors in the publication available

External Resource

There are no locators available

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

フルテキスト (公開)

公開されているフルテキストはありません

付随資料 (公開)

There is no public supplementary material available

引用

Schillinger, W., Zhang, D., Dehm, G., Bartels, A., & Clemens, H. (2001). Creep Behavior and Microstructural Stability of Lamellar gamma-TiAl (Cr,Mo,Si,B) with Extremely Fine Lamellar Spacing. In Materials Research Society Symposium - Proceedings (pp. N141-N146).

引用: https://hdl.handle.net/21.11116/0000-0001-95CE-F

要旨

要旨はありません