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Journal Article

Direct measurement of key exciton properties: Energy, dynamics, and spatial distribution of the wave function

MPS-Authors
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Hübener,  H.
Theory Group, Theory Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Center for Free Electron Laser Science;

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Rubio,  A.
Theory Group, Theory Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Center for Free Electron Laser Science;

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ntls.10010.pdf
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ntls10010-sup-0001-suppmat.zip
(Supplementary material), 15MB

Citation

Dong, S., Puppin, M., Pincelli, T., Beaulieu, S., Christiansen, D., Hübener, H., et al. (2021). Direct measurement of key exciton properties: Energy, dynamics, and spatial distribution of the wave function. Natural Sciences, 1(1): e10010. doi:10.1002/ntls.10010.


Cite as: https://hdl.handle.net/21.11116/0000-0008-A6D0-1
Abstract
Excitons, Coulomb-bound electron–hole pairs, are the fundamental excitations governing the optoelectronic properties of semiconductors. Although optical signatures of excitons have been studied extensively, experimental access to the excitonic wave function itself has been elusive. Using multidimensional photoemission spectroscopy, we present a momentum-, energy-, and time-resolved perspective on excitons in the layered semiconductor WSe2. By tuning the excitation wavelength, we determine the energy–momentum signature of bright exciton formation and its difference from conventional single-particle excited states. The multidimensional data allow to retrieve fundamental exciton properties like the binding energy and the exciton–lattice coupling and to reconstruct the real-space excitonic distribution function via Fourier transform. All quantities are in excellent agreement with microscopic calculations. Our approach provides a full characterization of the exciton properties and is applicable to bright and dark excitons in semiconducting materials, heterostructures, and devices.