Electron Channelling Contrast Imaging (ECCI) – A Technique for Observation and 
Quantitative In-situ Characterization of Crystal Lattice Defects in Bulk Samples

Zaefferer, Stefan

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Electron Channelling Contrast Imaging (ECCI) – A Technique for Observation and Quantitative In-situ Characterization of Crystal Lattice Defects in Bulk Samples

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Zaefferer, Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S. (2020). Electron Channelling Contrast Imaging (ECCI) – A Technique for Observation and Quantitative In-situ Characterization of Crystal Lattice Defects in Bulk Samples. Talk presented at 12th Asia-Pacific Microscopy Conference (APMC 2020). Hyderabad, India. 2020-02-03 - 2020-02-07.

引用: https://hdl.handle.net/21.11116/0000-0009-47B1-F

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