Infrared Electronic speckle pattern interferometry at 10 µm

[en] Demonstration of electronic speckle pattern interferometry of opaque scattering objects at 10 µm wavelength using a commercial thermal-camera is presented for the first time to our knowledge. The idea of using a wavelength longer than the usual visible ones is to render such holographic displacement measurement techniques less sensitive to external perturbations. We have observed the rotation of a metallic plate and applied the phase-shifting technique for quantitative measurements

Disciplines :

Physics

Author, co-author :

Vandenrijt, Jean-François ; Université de Liège - ULiège > CSL (Centre Spatial de Liège)

Georges, Marc ; Université de Liège - ULiège > CSL (Centre Spatial de Liège)

Language :

English

Title :

Infrared Electronic speckle pattern interferometry at 10 µm

Publication date :

June 2007

Event name :

Optical Measurement Systems for Industrial Inspection

Event organizer :

Society of Photo-Optical Instrumentation Engineers

Event place :

Munich, Germany

Event date :

18-21 June 2007

Audience :

International

Main work title :

Optical Measurement Systems for Industrial Inspection V

Editor :

Osten, W.

Gorecki, C.

Novak, E.

Publisher :

Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States

ISBN/EAN :

9780819467584

Collection name :

Proceedings of the Society of Photo-Optical Instrumentation Engineers, Vol. 6616

Pages :

66162Q1

Peer reviewed :

Peer reviewed

Available on ORBi :

since 19 January 2010

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